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| * Lofstrom, K. & Van Duzer, T. (1997, January). Josephson logic circuit with a sinusoidal current supply. ''IEEE Transactions on Magnetics'', 13 (1), 597-600. | * Lofstrom, K. & Van Duzer, T. (1977, January). Josephson logic circuit with a sinusoidal current supply. ''IEEE Transactions on Magnetics'', 13 (1), 597-600. |
Papers and Publications
MORE LATER - will finish the list someday
- Lofstrom, K. (1975). Sinusoidal Supply Josephson Junction Logic. MSEE Thesis, University of California at Berkeley.
Lofstrom, K. & Van Duzer, T. (1977, January). Josephson logic circuit with a sinusoidal current supply. IEEE Transactions on Magnetics, 13 (1), 597-600.
Lofstrom, K. (1981, November). The Launch Loop: A Low Cost Earth-to-High-Orbit Launch System. Readers Forum, American Astronautical Society News Letter, 20(6).
Lofstrom, K. (1982, August). The Launch Loop. L5 News 7(8), 8-10.
Lofstrom, K. (1983, December). The Launch Loop. Analog Magazine, 103(13), 67-80.
Lofstrom, K. (1985, July). The Launch Loop. AIAA-85-1368. 21st Joint Propulsion Conference, Monterey, CA.
Lofstrom, K. (1990, November). A World Much Like Our Own. Liberty Magazine, 10.
Lofstrom, K. (1996). A Demonstration IC for the P1149.4 Mixed Signal Test Standard. Proceedings of IEEE International Test Conference, 92-98.
Lofstrom, K. (1996). Early Capture for Boundary Scan Timing Measurements. Proceedings of IEEE International Test Conference, 417-422.
Lofstrom, K. (1997, September). Mixed Signal Test Scan - Past, Present, and Future. 10th Annual IEEE International ASIC Conference, Portland, OR.
Lofstrom, K. (1999). Peripheral Cell Design. In A. Ossieran(Ed.), Analog and Mixed-Signal Boundary-Scan, a guide to the IEEE 1149.4 Test Standard, Kluwer Press.
Lofstrom, K., Daasch, W. & Taylor, D. (2000). IC Identification Circuit using Device Mismatch. IEEE Cat. No. OOCH37056. IEEE International Solid-State Circuits Conference Digest of Technical Papers, 43, 372-373.
Lofstrom, K., Castaneda, D., Graff, B. & Cabbibo, A. (2004, June). ICID - Tracing Individual Die from Wafer Test through End-Of-Life. International Mixed Signal Test Workshop, Portland, Oregon.
Lofstrom, K. (2005, January-March). Dirvish Disk to Disk Backup System. Sysadmin Magazine.
Lofstrom, K. (2009, August). Launch Loop. Space Elevator Conference, Redmond WA.
Lofstrom, K. (2009, August). Server Sky. Space Elevator Conference, Redmond WA.
Lofstrom, K. (2009, October). Server Sky. AMSAT Symposium, Baltimore MD.